New Scanning Electron Microscope for improved mineralogical analyses on its way to GEUS

27-07-2017
News

GEUS has acquired a ZEISS Sigma 300VP Field Emission Scanning Electron Microscope, and we can now offer to make automated mineralogy analyses on entire thin sections or polished mounts relevant for mining and exploration as well as investigations of reservoirs (oil & gas and geothermal energy).

The new instrument will be delivered and installed in the autumn of 2017. The instrument will be equipped with 2 Bruker Xflash 6|30 129 eV EDS detectors, an Bruker e-FlashFS EBSD detector, a 185-850 nm Light-Guide Cathodoluminescence detector, and it is able to work under variable pressure conditions, with high vacuum condition of 3.25 x 10-4Pa and low vacuum conditions between 2-133 Pa.

The Scanning Electron Microscope will be equipped with the Mineralogic software platform for mining and reservoir rocks. With this software, we will be able to perform automated mineralogy on entire thin sections, polished mounts (e.g. drill cores, heavy mineral separates, cuttings samples) or parts thereof.